发明名称 Trench-based power semiconductor devices with increased breakdown voltage characteristics
摘要 Exemplary power semiconductor devices with features providing increased breakdown voltage and other benefits are disclosed.
申请公布号 US8932924(B2) 申请公布日期 2015.01.13
申请号 US201314058956 申请日期 2013.10.21
申请人 Fairchild Semiconductor Corporation 发明人 Yedinak Joseph A.;Probst Dean E.;Calafut Daniel
分类号 H01L21/336;H01L29/872;H01L29/78;H01L29/40;H01L29/10;H01L29/423;H01L29/417;H01L29/06 主分类号 H01L21/336
代理机构 代理人
主权项 1. A trench shielded Schottky barrier rectifier device, comprising: a first trench extending into a semiconductor region; a first dielectric layer lining opposing sidewalls of the first trench; a first shield electrode disposed in the first trench; a second trench extending into the semiconductor region parallel to the first trench; a second dielectric layer lining opposing sidewalls of the second trench; a second shield electrode disposed in the second trench; a mesa region defined by the first trench and the second trench, the mesa region having a width, a height, and a top surface; and a Schottky contact disposed at the top surface of the mesa, the Schottky contact having an end spaced from a terminal end of the first trench by at least a distance.
地址 South Portland ME US