发明名称 |
Trench-based power semiconductor devices with increased breakdown voltage characteristics |
摘要 |
Exemplary power semiconductor devices with features providing increased breakdown voltage and other benefits are disclosed. |
申请公布号 |
US8932924(B2) |
申请公布日期 |
2015.01.13 |
申请号 |
US201314058956 |
申请日期 |
2013.10.21 |
申请人 |
Fairchild Semiconductor Corporation |
发明人 |
Yedinak Joseph A.;Probst Dean E.;Calafut Daniel |
分类号 |
H01L21/336;H01L29/872;H01L29/78;H01L29/40;H01L29/10;H01L29/423;H01L29/417;H01L29/06 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
1. A trench shielded Schottky barrier rectifier device, comprising:
a first trench extending into a semiconductor region; a first dielectric layer lining opposing sidewalls of the first trench; a first shield electrode disposed in the first trench; a second trench extending into the semiconductor region parallel to the first trench; a second dielectric layer lining opposing sidewalls of the second trench; a second shield electrode disposed in the second trench; a mesa region defined by the first trench and the second trench, the mesa region having a width, a height, and a top surface; and a Schottky contact disposed at the top surface of the mesa, the Schottky contact having an end spaced from a terminal end of the first trench by at least a distance. |
地址 |
South Portland ME US |