发明名称 ANALYZING LIGHT BY MODE INTERFERENCE
摘要 <p>Apparatuses and systems for analyzing light by mode interference are provided. An example of an apparatus for analyzing light by mode interference includes a number of waveguides to support in a multimode region two modes of the light of a particular polarization and a plurality of scattering objects offset from a center of at least one of the number of waveguides.</p>
申请公布号 KR20150003715(A) 申请公布日期 2015.01.09
申请号 KR20147020907 申请日期 2012.04.25
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 SANTORI CHARLES M.;LIANG DI;FIORENTINO MARCO;FATTAL DAVID A.;PENG ZHEN;BEAUSOLEIL RAYMOND G.;FARAON ANDREI
分类号 G01J3/45 主分类号 G01J3/45
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