发明名称 Transistor and method of fabricating the same
摘要 A transistor including a gate, an active stacked structure, a dielectric layer, a source and a drain. The gate is located over a first surface of the dielectric layer. The active stacked structure, including a first active layer and a second active layer, is located over a second surface of the dielectric layer. The source and the drain are located over the second surface of the dielectric layer and at two sides of the active stacked structure and extend between the first active layer and the second active layer of the active stacked structure.
申请公布号 US8928046(B2) 申请公布日期 2015.01.06
申请号 US201012903220 申请日期 2010.10.13
申请人 Industrial Technology Research Institute 发明人 Yan Jing-Yi;Hung Chu-Yin;Yao Hsiao-Chiang;Wu Yen-Yu;Huang Yen-Shih
分类号 H01L29/76;H01L29/66;H01L27/12;H01L29/417;H01L29/786;H01L27/32 主分类号 H01L29/76
代理机构 Jianq Chyun IP Office 代理人 Jianq Chyun IP Office
主权项 1. A transistor, comprising: a dielectric layer having a first surface and a second surface; a gate located on the first surface of the dielectric layer; an active stacked structure located on the second surface of the dielectric layer, wherein the active stacked structure is consisted of two layers including a first active layer and a second active layer, wherein the second active layer is a top layer of the active stacked structure, a material of the first active layer comprises a first semiconductor and a material of the second active layer comprises a second semiconductor, a composition of the first semiconductor and a composition of the second semiconductor are the same, and a constituent ratio of oxygen of the first semiconductor is lower than a constituent ratio of oxygen of the second semiconductor; and a source and a drain located on the second surface of the dielectric layer and at two sides of the active stacked structure respectively, wherein the source and the drain extend between the first active layer and the second active layer of the active stacked structure.
地址 Hsinchu TW