发明名称 |
FIELD EFFECT TRANSISTOR AND METHOD FOR FORMING THE SAME |
摘要 |
A field effect transistor and a method for forming the same are provided. The field effect transistor comprises: a substrate (100); an ultra-thin insulator layer (200) formed on the substrate (100), wherein a material of the ultra-thin insulator layer (200) is a monocrystalline rare earth oxide or a monocrystalline beryllium oxide; an ultra-thin semiconductor monocrystalline film (300) formed on the ultra-thin insulator layer (200); and a gate stack (400) formed on the ultra-thin semiconductor monocrystalline film (300), and comprising a gate dielectric (410) and a gate electrode (420) formed on the gate dielectric (410). |
申请公布号 |
US2015001623(A1) |
申请公布日期 |
2015.01.01 |
申请号 |
US201314110555 |
申请日期 |
2013.08.20 |
申请人 |
TSINGHUA UNIVERSITY |
发明人 |
Wang Jing;Liang Renrong;Xu Jun |
分类号 |
H01L29/786;H01L29/66 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A field effect transistor, comprising:
a substrate; an ultra-thin insulator layer formed on the substrate, wherein a material of the ultra-thin insulator layer is a monocrystalline rare earth oxide or a monocrystalline beryllium oxide; an ultra-thin semiconductor monocrystalline film formed on the ultra-thin insulator layer; and a gate stack formed on the ultra-thin semiconductor monocrystalline film, and comprising a gate dielectric and a gate electrode formed on the gate dielectric. |
地址 |
Beijing CN |