发明名称 イオンガイド及び質量分析装置
摘要 <p>A curved ion guide (2) includes four curved rod electrodes (201-204) arranged around a curved central axis (O), two deflecting auxiliary electrodes (205, 206) which are located on a plane P on which the curved central axis (O) lies and which face each other across the axis (O), and two focusing auxiliary electrodes (207, 208) which are located on a curved surface orthogonal to the plane P and including the axis (O) and which face each other across the axis (O). Ions are focused by the effect of an electric field created by radio-frequency voltages applied to the curved rod electrodes, and a deflecting electric field having the effect of curving ions along the axis (O) is created by direct-current voltages applied to the deflecting auxiliary electrodes. Furthermore, a focusing direct-current electric field having the effect of pushing ions from the vicinity of the focusing auxiliary electrodes toward the axis (O) is created by a direct-current voltage having the same polarity as that of the ions and applied to the focusing auxiliary electrodes. The spatial spread of ions having large amounts of energy is suppressed by the effect of this focusing direct-current electric field, and the ions efficiently arrive at the exit end of the ion guide.</p>
申请公布号 JP5644863(B2) 申请公布日期 2014.12.24
申请号 JP20120548599 申请日期 2010.12.17
申请人 发明人
分类号 H01J49/06;G01N27/62 主分类号 H01J49/06
代理机构 代理人
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