发明名称 |
ELECTRIC CIRCUIT EVALUATION METHOD |
摘要 |
The electric circuit evaluation method according to the present invention comprises: a step for finding a malfunction power frequency property, in which the magnitude of a critical noise signal at which a designated electric circuit causes a malfunction is represented by the power injected into the designated electric circuit; and a step for finding a malfunction current frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a current (I_LSI) flowing to a predetermined portion of the designated electric circuit, and a malfunction voltage frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a voltage (V_LSI) occurring between predetermined points of the designated electric circuit, both of which properties found from the malfunction power frequency property. |
申请公布号 |
US2014368212(A1) |
申请公布日期 |
2014.12.18 |
申请号 |
US201414296554 |
申请日期 |
2014.06.05 |
申请人 |
ROHM CO., LTD. |
发明人 |
HIRAGA Noriaki |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
1. An electric circuit evaluation method comprising the following steps:
a step for finding a malfunction power frequency property, in which the magnitude of a critical noise signal at which a designated electric circuit causes a malfunction is represented by the power injected into the designated electric circuit; and a step for finding a malfunction current frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a current flowing to a predetermined portion of the designated electric circuit, and a malfunction voltage frequency property, in which the magnitude of the critical noise signal at which the designated electric circuit causes a malfunction is represented by a voltage occurring between predetermined points of the designated electric circuit, both of which properties being found from the malfunction power frequency property. |
地址 |
Kyoto JP |