发明名称 Contactor with multi-pin device contacts
摘要 A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode includes a tester load board and a contactor body coupled to the tester load board. A plurality of contactor pins carried by the contactor body includes a first contactor pin and a second contactor pin that are electrically coupled to the tester load board. The tester load board is configured to couple the plurality of contactor pins to automatic test equipment (ATE) for testing the DUT. The first contactor pin and second contactor pin are positioned to both contact the first electrode. A first path to the first contactor pin and a second path to the second contactor pin are electrically shorted together by the contactor assembly to be electrically in parallel to provide redundant paths to the first electrode during automated testing of the DUT.
申请公布号 US8912810(B2) 申请公布日期 2014.12.16
申请号 US201113228579 申请日期 2011.09.09
申请人 Texas Instruments Incorporated 发明人 Hsu Stanley;Lee Chi-Tsung;Gibbs Byron Harry
分类号 G01R31/20;G01R1/073 主分类号 G01R31/20
代理机构 代理人 Shaw Steven A.;Telecky, Jr. Frederick J.
主权项 1. A contactor assembly for automated testing a device under test (DUT) that includes a plurality of separate electrodes including a first electrode, comprising: a tester load board; a contactor body coupled to said tester load board; a plurality of contactor pins carried by said contactor body comprising a first contactor pin and a second contactor pin that are electrically coupled to said tester load board, wherein said tester load board is configured to couple said plurality of contactor pins to automatic test equipment (ATE) for testing said DUT, wherein said first contactor pin and said second contactor pin are positioned to both contact said first electrode, and wherein a first path to said first contactor pin and a second path to said second contactor pin are electrically shorted together by said contactor assembly to be electrically in parallel to provide redundant paths to said first electrode during said automated testing of said DUT; and a plurality of sleeves attached to said contactor body, and wherein said first contactor in and said second contactor pin are within and shorted together by one of said plurality of sleeves.
地址 Dallas TX US
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