发明名称 CALIBRATED TEMPERATURE MEASUREMENT SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide a calibrated temperature measurement system.SOLUTION: In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal on the basis of a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may have resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value on the basis of the first digital signal, determine a second digital value on the basis of the second digital signal, calculate a resistance ratio on the basis of the first digital value and the second digital value, and determine a temperature output value on the basis of the resistance ratio and the resistor-characterization information.</p>
申请公布号 JP2014232108(A) 申请公布日期 2014.12.11
申请号 JP20140110166 申请日期 2014.05.28
申请人 INTEL IP CORP 发明人 MERIT HONG;DAVID HARNISHFEGER;KRIS KAUFMAN
分类号 G01K7/24 主分类号 G01K7/24
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