| 发明名称 |
Subatomic particle detector capable of ignoring shock induced counts |
| 摘要 |
A subatomic particle detection apparatus includes a scintillator to scintillate if struck by subatomic particles, and to scintillate if subjected to mechanical stresses, the scintillator to emit an electrical discharge if scintillating due to the mechanical stresses. A detector is optically coupled to the scintillator to detect scintillations by the scintillator. Furthermore, an antenna is associated with the scintillator and/or the detector to detect the electrical discharge. In addition, circuitry is coupled to the detector and the antenna to determine whether the scintillator scintillated due to the mechanical stresses, based upon the antenna detecting the electrical discharge. |
| 申请公布号 |
US8907289(B2) |
申请公布日期 |
2014.12.09 |
| 申请号 |
US201213450796 |
申请日期 |
2012.04.19 |
| 申请人 |
Schlumberger Technology Corporation |
发明人 |
Wraight Peter David |
| 分类号 |
G01T1/20 |
主分类号 |
G01T1/20 |
| 代理机构 |
|
代理人 |
Hewitt Cathy |
| 主权项 |
1. A subatomic particle detection apparatus comprising:
a scintillator to scintillate if struck by subatomic particles, and to scintillate if subjected to mechanical stresses, the scintillator to emit an electrical discharge if scintillating due to the mechanical stresses; a detector optically coupled to the scintillator to detect scintillations by the scintillator; an antenna associated with the scintillator and/or the detector to detect the electrical discharge; and circuitry coupled to the detector and the antenna to determine whether the scintillator scintillated due to the mechanical stresses, based upon the antenna detecting the electrical discharge. |
| 地址 |
Sugar Land TX US |
