发明名称 RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a resist composition and a resist pattern forming method.SOLUTION: The resist composition contains: a base component whose solubility in a developer changes by the action of an acid; and an acid generator component which generates an acid upon exposure. The base component contains a polymer compound having a constituent unit represented by a formula (a0-1), and the acid generator component contains a compound represented by a formula (b1).
申请公布号 JP2014224993(A) 申请公布日期 2014.12.04
申请号 JP20140067153 申请日期 2014.03.27
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KOMURO YOSHITAKA;MAEBASHI TAKAYA;NAGAMINE TAKASHI
分类号 G03F7/004;C08F20/34;C08F20/38;C08F20/54;G03F7/038;G03F7/039;H01L21/027 主分类号 G03F7/004
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