发明名称 |
RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition and a resist pattern forming method.SOLUTION: The resist composition contains: a base component whose solubility in a developer changes by the action of an acid; and an acid generator component which generates an acid upon exposure. The base component contains a polymer compound having a constituent unit represented by a formula (a0-1), and the acid generator component contains a compound represented by a formula (b1). |
申请公布号 |
JP2014224993(A) |
申请公布日期 |
2014.12.04 |
申请号 |
JP20140067153 |
申请日期 |
2014.03.27 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
KOMURO YOSHITAKA;MAEBASHI TAKAYA;NAGAMINE TAKASHI |
分类号 |
G03F7/004;C08F20/34;C08F20/38;C08F20/54;G03F7/038;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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