发明名称 DEVICE AND METHOD MEASURING PIM OF MULTI-BAND
摘要 The present invention relates to a device for measuring PIM of a multi-band and a measuring method thereof. Provided is the device for measuring the PIM of the multi-band comprising a first signal generating device which generates a first frequency signal; a second signal generating device which generates a second frequency signal; a first power amp which generates an amplification first frequency signal by amplifying the first frequency signal; a second power amp which generates an amplification second frequency signal by amplifying the second frequency signal; a combiner which generates one test signal by composing the amplification first frequency signal and the amplification second frequency signal; a switching unit which generates a classified test signal by classifying the test signal according to the frequency and designates the path of the classified test signal; a multiplexer which receives the classified test signal from the switching unit, transmits the classified test signal to a measured device, filters the PIM component of the measured device according to the classified test signal, and removes the same; and a single output port which connects the multiplexer and the measured device.
申请公布号 KR101466949(B1) 申请公布日期 2014.12.03
申请号 KR20130135748 申请日期 2013.11.08
申请人 INNERTRON, INC. 发明人 SEO, SOO DUK;JOO, JAE HYUN
分类号 H04B17/00;H04B1/52 主分类号 H04B17/00
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