发明名称 METHOD AND A MASS SPECTROMETER AND USES THEREOF FOR DETECTING IONS OR SUBSEQUENTLY-IONISED NEUTRAL PARTICLES FROM SAMPLES
摘要 A method is used in a time-of-flight mass spectrometer for analysis of a first pulsed ion beam, the ions of which are disposed along the pulse direction, separated with respect to their ion masses. The ions of at least one individual predetermined ion mass or of at least one predetermined range of ion masses can be decoupled from the first pulsed ion beam, as at least one decoupled ion beam, and the first ion beam and the at least one decoupled ion beam are analyzed.
申请公布号 US2014346340(A1) 申请公布日期 2014.11.27
申请号 US201414336252 申请日期 2014.07.21
申请人 ION-TOF TECHNOLOGIES GMBH 发明人 NIEHUIS EWALD
分类号 H01J49/40;H01J49/00 主分类号 H01J49/40
代理机构 代理人
主权项
地址 Muenster DE