| 摘要 |
The invention relates to an optical component made of synthetic quartz glass for use in an ArF excimer laser lithography process with an applied wavelength of 193 nm, comprising a glass structure substantially free of oxygen defect sites, a hydrogen content ranging from 0.1 x 1016 molecules/cm3 to 1.0 x 1018 molecules/cm3, an SiH group content of less than 2 x 1017 molecules/cm3, and a hydroxyl group content ranging from 0.1 to 100 wt. ppm, said glass structure having a fictive temperature of less than 1070 °C. The aim of the invention is to allow a reliable prediction of the compacting behavior when using UV laser radiation with the applied wavelength on the basis of a measurement of the compacting behavior using a measured wavelength of 633 nm. This is achieved by an optical component design in which the component undergoes a laser-induced change in the refractive index in response to irradiation by means of a radiation with a wavelength of 193 nm using 5x109 pulses with a pulse width of 125 ns and a respective energy density of 500 µJ/cm2 at a pulse repetition frequency of 2000 Hz, said change totaling a first measured value M193nm when measured using the applied wavelength of 193 nm and totaling a second measured value M633nm when measured using a measured wavelength of 633 nm, wherein M193nm/M633nm < 1.7. |
