发明名称 SEMICONDUCTOR DEVICE
摘要 A vertical MOSFET includes: a semiconductor substrate comprising a drain layer, a drift layer, a body layer, and a source layer; and a trench gate penetrating through the source layer and the body layer from an upper surface of the semiconductor substrate and reaching the drift layer. The trench gate includes a gate electrode; a first insulating film disposed on a bottom surface of a trench formed in the semiconductor substrate; a second insulating film disposed at least on a side surface of the trench, and in contact with the body layer; and a third insulating film disposed between the gate electrode and the second insulating film, and formed of a material of which dielectric constant is higher than a dielectric constant of the second insulating film.
申请公布号 US2014346592(A1) 申请公布日期 2014.11.27
申请号 US201214363523 申请日期 2012.12.06
申请人 Soeno Akitaka;Yamamoto Toshimasa;Watanabe Yukihiko 发明人 Soeno Akitaka;Yamamoto Toshimasa;Watanabe Yukihiko
分类号 H01L29/78;H01L29/423;H01L29/10;H01L29/51 主分类号 H01L29/78
代理机构 代理人
主权项 1. A vertical MOSFET comprising: a semiconductor substrate comprising a first conductivity type drain layer, a first conductivity type drift layer formed on an upper surface of the drain layer, a second conductivity type body layer formed on an upper surface of the drift layer, and a first conductivity type source layer formed on a part of an upper surface of the body layer; and a trench gate penetrating through the source layer and the body layer from an upper surface of the semiconductor substrate and reaching the drift layer;wherein the trench gate comprises: a gate electrode;a first insulating film disposed on a bottom surface of a trench formed in the semiconductor substrate and in contact with the drift laver;a second insulating film disposed on a side surface of the trench and upper surface of the first insulating film, and in contact with the body layer; anda third insulating film disposed between the gate electrode and the second insulating film, and formed of a material of which dielectric constant is higher than a dielectric constant of the second insulating film.
地址 Toyota-shi JP