发明名称 CUTTING DEVICE FOR MICRO SAMPLE AND CUTTING METHOD FOR MICRO SPECOMEN
摘要 <p>A microsample cutting device according to the present invention comprises: a stage on which a sample is placed, moving the placed sample in X and Y axial directions; a blade jig to which a blade is coupled in one direction, and moved in one side of the stage in X, Y, and Z axial directions; a probe jig to which a probe is coupled in the other direction, and moved in the other side of the stage in the X, Y, and Z axial directions; and a microscope arranged above the stage. A microspecimen cutting method according to an embodiment of the present invention comprises: a step S1 of arranging the sample on the stage and determining a center point; a step S2 of forming a pair of cutting lines based on the center point determined in the step S1; a step S3 of rotating the sample with the cutting lines formed in the step S2; and a step S4 of forming a pair of cutting lines based on the center point of the sample rotated in the step S3. The cutting lines formed in the step S2 and S4 are connected to each other to form a specimen which is able to be separated from the sample. The microsample cutting device and the microspecimen cutting method according to the present invention can obtain the reliability of cutting the microsample and can reduce costs required for the cutting by cutting the sample arranged on the stage using the blade while checking the sample with naked eyes.</p>
申请公布号 KR20140133143(A) 申请公布日期 2014.11.19
申请号 KR20130052806 申请日期 2013.05.10
申请人 KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 PARK, JONG HO;SONG, KYU SEOK
分类号 G01N1/28 主分类号 G01N1/28
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