发明名称 |
Method for manufacturing semiconductor device, and semiconductor substrate |
摘要 |
A method for manufacturing a semiconductor device includes forming at least one stripe-shaped protection film over a multilayer film in a scribe region of a semiconductor substrate having a plurality of semiconductor element regions formed therein, the protection film having a thickness larger in a center portion thereof than at an end surface thereof and being made of a member which transmits a laser beam, and removing the multilayer film in the scribe region by irradiating the protection film with a laser beam. |
申请公布号 |
US8890292(B2) |
申请公布日期 |
2014.11.18 |
申请号 |
US201314028601 |
申请日期 |
2013.09.17 |
申请人 |
Fujitsu Semiconductor Limited |
发明人 |
Watanabe Naoyuki |
分类号 |
H01L23/544;H01L23/00;H01L21/78 |
主分类号 |
H01L23/544 |
代理机构 |
Westerman, Hattori, Daniels & Adrian, LLP |
代理人 |
Westerman, Hattori, Daniels & Adrian, LLP |
主权项 |
1. A semiconductor substrate comprising:
a plurality of semiconductor element regions; and at least one stripe-shaped protection film formed over a multilayer film in a scribe region, the protection film including a first portion which is located at a center of the protection film and a second portion which is located at an edge of the protection film, a thickness of the first portion being larger than a thickness of the second portion, the protection film being made of a member which transmits a laser beam, and an upper surface of the first portion being higher than an upper surface of the second portion from the semiconductor substrate. |
地址 |
Yokohama-shi, Kanagawa JP |