发明名称 Method for manufacturing semiconductor device, and semiconductor substrate
摘要 A method for manufacturing a semiconductor device includes forming at least one stripe-shaped protection film over a multilayer film in a scribe region of a semiconductor substrate having a plurality of semiconductor element regions formed therein, the protection film having a thickness larger in a center portion thereof than at an end surface thereof and being made of a member which transmits a laser beam, and removing the multilayer film in the scribe region by irradiating the protection film with a laser beam.
申请公布号 US8890292(B2) 申请公布日期 2014.11.18
申请号 US201314028601 申请日期 2013.09.17
申请人 Fujitsu Semiconductor Limited 发明人 Watanabe Naoyuki
分类号 H01L23/544;H01L23/00;H01L21/78 主分类号 H01L23/544
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A semiconductor substrate comprising: a plurality of semiconductor element regions; and at least one stripe-shaped protection film formed over a multilayer film in a scribe region, the protection film including a first portion which is located at a center of the protection film and a second portion which is located at an edge of the protection film, a thickness of the first portion being larger than a thickness of the second portion, the protection film being made of a member which transmits a laser beam, and an upper surface of the first portion being higher than an upper surface of the second portion from the semiconductor substrate.
地址 Yokohama-shi, Kanagawa JP