发明名称 Display device
摘要 A semiconductor device including a first gate electrode and a second gate electrode formed apart from each other over an insulating surface, an oxide semiconductor film including a region overlapping with the first gate electrode with a gate insulating film interposed therebetween, a region overlapping with the second gate electrode with the gate insulating film interposed therebetween, and a region overlapping with neither the first gate electrode nor the second gate electrode, and an insulating film covering the gate insulating film, the first gate electrode, the second gate electrode, and the oxide semiconductor film, and being in direct contact with the oxide semiconductor film is provided.
申请公布号 US8884302(B2) 申请公布日期 2014.11.11
申请号 US201313777106 申请日期 2013.02.26
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Inoue Seiko;Miyake Hiroyuki;Toyotaka Kouhei
分类号 H01L29/04;H01L29/15;H01L31/036;H01L29/10;H01L31/0376;H01L31/20;H01L29/786;H01L27/12 主分类号 H01L29/04
代理机构 Robinson Intellectual Property Law Office, P.C. 代理人 Robinson Eric J.;Robinson Intellectual Property Law Office, P.C.
主权项 1. A semiconductor device comprising: a first gate electrode and a second gate electrode apart from each other over an insulating surface; an oxide semiconductor film comprising a region overlapping with the first gate electrode with a gate insulating film interposed therebetween, a region overlapping with the second gate electrode with the gate insulating film interposed therebetween, and a region overlapping with neither the first gate electrode nor the second gate electrode; one of a source electrode and a drain electrode overlapping with a part of the first gate electrode and a part of the oxide semiconductor film; the other of the source electrode and the drain electrode overlapping with a part of the second gate electrode and a part of the oxide semiconductor film; and an insulating film covering the gate insulating film, the first gate electrode, the second gate electrode, the oxide semiconductor film, the source electrode, and the drain electrode, the insulating film being in direct contact with the oxide semiconductor film.
地址 Atsugi-shi, Kanagawa-ken JP