发明名称 RADIATION ILLUMINANCE MEASURING DEVICE FOR MICROSCOPE, AND MICROSCOPE PROVIDED WITH THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a radiation illuminance measuring device for a microscope, for accurately measuring the irradiance on a sample surface.SOLUTION: A radiation illuminance measuring device 10 for measuring the irradiance of light emitted from an objective lens 7 of a microscope 1 includes: a lens part 20 including a single lens having a positive power with a substantially flat surface facing the objective lens 7 side; and a light-sensitive detector 30 for detecting light for measuring the irradiance of light in the substantially flat surface, in order in which the light emitted from the objective lens 7 progresses.</p>
申请公布号 JP2014209088(A) 申请公布日期 2014.11.06
申请号 JP20140002775 申请日期 2014.01.09
申请人 OLYMPUS CORP 发明人 KUSAKA KENICHI
分类号 G01J1/02;G01J1/04;G02B13/00;G02B21/00 主分类号 G01J1/02
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