发明名称 |
METHOD OF REPAIRING PROBE BOARD AND PROBE BOARD USING THE SAME |
摘要 |
There is provided a method of repairing a probe board, the method including: preparing a plurality of first via electrodes filled with a first filling material in a board body formed as a ceramic sintered body; forming a via hole for an open via electrode among the plurality of first via electrodes; filling the via hole with a second filling material having a lower sintering temperature than that of the first filling material; and forming a second via electrode by sintering the second filling material. The open via repair according to the present invention improves the manufacturing yield of the board and reduces the manufacturing costs thereof. |
申请公布号 |
US2014318838(A1) |
申请公布日期 |
2014.10.30 |
申请号 |
US201414330882 |
申请日期 |
2014.07.14 |
申请人 |
Samsung Electro-Mechanics Co., Ltd. |
发明人 |
CHANG Myung Whun;LEE Dae Hyeong;HONG Ki Pyo |
分类号 |
H05K1/11;G01R1/02 |
主分类号 |
H05K1/11 |
代理机构 |
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代理人 |
|
主权项 |
1. A probe board comprising:
a board body formed as a ceramic sintered body; a plurality of first via electrodes formed in the board body, the first via electrodes being filled with a first filling material; and a second via electrode filled with a second filling material having a lower sintering temperature than that of the first filling material. |
地址 |
Suwon KR |