发明名称 |
Segmented planar calibration for correction of errors in time of flight mass spectrometers |
摘要 |
An ion detector system for a mass spectrometer is disclosed comprising an ion detector comprising an array of detector elements. The ion detector system is arranged to correct for tilt and non-linear aberrations in an isochronous plane of ions. The ion detector system generates separate first mass spectral data sets for each detector element and then applies a calibration coefficient to each of the first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets. The plurality of second calibrated mass spectral data sets are then combined to form a composite mass spectral data set. |
申请公布号 |
US8872104(B2) |
申请公布日期 |
2014.10.28 |
申请号 |
US201214117756 |
申请日期 |
2012.05.16 |
申请人 |
Micromass UK Limited |
发明人 |
Langridge David J.;Wildgoose Jason Lee |
分类号 |
B01D59/44;H01J49/00;H01J49/02 |
主分类号 |
B01D59/44 |
代理机构 |
Diederiks & Whitelaw, PLC |
代理人 |
Diederiks & Whitelaw, PLC |
主权项 |
1. An ion detector system for a mass spectrometer, wherein said ion detector system is arranged and adapted to correct for tilt or one or more non-linear aberrations in an isochronous plane of ions, wherein said isochronous plane is the plane of best fit of ions having a particular mass to charge ratio at a particular point in time;
wherein said ion detector system comprises an ion detector comprising a 1D or 2D array of detector elements; and wherein said ion detector system is arranged and adapted: (i) to generate separate first mass spectral data sets for each detector element; (ii) to apply a calibration coefficient to each of said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets; and (iii) to combine said plurality of second calibrated mass spectral data sets to form a composite mass spectral data set. |
地址 |
Wilmslow GB |