发明名称 Segmented planar calibration for correction of errors in time of flight mass spectrometers
摘要 An ion detector system for a mass spectrometer is disclosed comprising an ion detector comprising an array of detector elements. The ion detector system is arranged to correct for tilt and non-linear aberrations in an isochronous plane of ions. The ion detector system generates separate first mass spectral data sets for each detector element and then applies a calibration coefficient to each of the first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets. The plurality of second calibrated mass spectral data sets are then combined to form a composite mass spectral data set.
申请公布号 US8872104(B2) 申请公布日期 2014.10.28
申请号 US201214117756 申请日期 2012.05.16
申请人 Micromass UK Limited 发明人 Langridge David J.;Wildgoose Jason Lee
分类号 B01D59/44;H01J49/00;H01J49/02 主分类号 B01D59/44
代理机构 Diederiks & Whitelaw, PLC 代理人 Diederiks & Whitelaw, PLC
主权项 1. An ion detector system for a mass spectrometer, wherein said ion detector system is arranged and adapted to correct for tilt or one or more non-linear aberrations in an isochronous plane of ions, wherein said isochronous plane is the plane of best fit of ions having a particular mass to charge ratio at a particular point in time; wherein said ion detector system comprises an ion detector comprising a 1D or 2D array of detector elements; and wherein said ion detector system is arranged and adapted: (i) to generate separate first mass spectral data sets for each detector element; (ii) to apply a calibration coefficient to each of said first mass spectral data sets to produce a plurality of second calibrated mass spectral data sets; and (iii) to combine said plurality of second calibrated mass spectral data sets to form a composite mass spectral data set.
地址 Wilmslow GB