| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device comprising a logical circuit that can perform a scan test and suppress delay of signals.SOLUTION: A semiconductor device comprises: a combination circuit; a plurality of sequential circuits holding first data supplied to the combination circuit or second data outputted from the combination circuit; a plurality of first storage circuits each having a function to hold the first data supplied to the corresponding sequential circuits and a function to hold the second data outputted from the corresponding sequential circuits; and a plurality of second storage circuits for electrically connecting the first storage circuits in series by supplying the first data or the second data supplied from one of the first storage circuits to another first storage circuit. The second storage circuits each comprise: a first switch controlling supply of the first data or the second data to a node; a capacitive element electrically connected to the node; and a second switch for controlling output of the first data or the second data from the node.</p> |
