COMPUTING DEVICE AND METHOD FOR TESTING LAYOUT OF POWER PIN OF CHIPSET ON CIRCUIT BOARD

摘要

A testing system for testing a layout of a power pin of a chipset on a circuit board includes a layout information obtaining module, a power pin sorting module, a transmission line sorting module, a transmission line length calculating module, and a report generating module. The layout information obtaining module obtains layout information of the printed circuit board. The power pin sorting module sorts the power pin from a number of pins of the chipset. The transmission line sorting module sorts transmission lines that are connected to the power pin and are located on outer layers of the printed circuit board. The transmission line length calculating module calculates a total length of the transmission lines sorted by the transmission line sorting module and compares the total length with a threshold length. The report generating module generates a testing report indicating whether or not the power pin is qualified.

主权项

1. A computing device for testing a layout of a power pin of a chipset on a circuit board, the computing device comprising:
a storage device; a processor coupled to the storage device; and one or more programs stored in the storage device and executed by the processor, the one or more programs comprising:
a layout information obtaining module configured to obtain layout information of the printed circuit board;a power pin sorting module configured to sort the power pin from a plurality of pins of the chipset based on the layout information of the printed circuit board;a transmission line sorting module configured to sort transmission lines connected to the power pin and located on outer layers of the printed circuit board;a transmission line length calculating module configured to calculate a total length of the transmission lines sorted by the transmission line sorting module and compare the total length with a threshold length; anda report generating module configured to generate a testing report indicating whether the power pin is qualified based on a compared result of the total length and the threshold length.