发明名称 X-RAY INSPECTION APPARATUS FOR CONTINUOUSLY TRANSFERRED PRODUCTS AND X-RAY INSPECTION METHOD USING SAME
摘要 <p>The present invention relates to an X-ray inspection apparatus for continuously transferred products and an X-ray inspection method using the same, and more specifically, to an X-ray inspection apparatus for products such as mobile devices transferred continuously through a means such as a conveyer and an X-ray inspection method using the same. The inspection method comprises: a step of determining detection factors for fair quality products and determining parameter values for the detection factors to store and register the determined parameter values; and a step of detecting the detection factors from subjects being inspected on the basis of the stored and registered parameter values for the detection factors and determining whether the inspection objects are defective by using the threshold values of the predetermined parameters, and the subjects being inspected are supplied continuously.</p>
申请公布号 WO2014168432(A1) 申请公布日期 2014.10.16
申请号 WO2014KR03117 申请日期 2014.04.10
申请人 XAVIS CO.,LTD 发明人 KIM, HYEONG-CHEOLL;JEONG, TAEK-GEUN;JO, DOO-YONG
分类号 G01N23/04 主分类号 G01N23/04
代理机构 代理人
主权项
地址