SYSTEM AND METHOD FOR MEASURING AN INTEGRATED CIRCUIT AGE

摘要

A system and method are provided for measuring an integrated circuit age. A first clock generator is provided for generating a first dock signal. Additionally, a second clock generator is provided for generating a second clock signal. Further, a phase detector is provided that is in communication with the first dock generator and the second dock generator. The phase detector is operable for receiving the first clock signal from the first clock generator and the second clock signal from the second dock generator, and outputting a phase difference signal. Still yet, a circuit is provided that is in communication with the phase detector and the first clock generator. The circuit is operable for receiving the first clock signal from the first clock generator and the phase difference signal from the phase detector. The circuit is further operable for synchronizing the phase difference signal from the phase detector with the first dock signal from the first clock generator. Moreover, the phase difference signal is capable of being used as a measure of an integrated circuit age.

主权项

1. An apparatus, comprising:
a first clock generator for generating a first clock signal; a second clock generator for generating a second dock signal; a phase detector in communication with the first clock generator and the second clock generator, the phase detector operable for receiving the first clock signal from the first clock generator and the second clock signal from the second clock generator, and outputting a phase difference signal; and a circuit in communication with the phase detector and the first clock generator, the circuit operable for receiving the first clock signal from the first clock generator and the phase difference signal from the phase detector, the circuit further operable for synchronizing the phase difference signal from the phase detector with the first clock signal from the first clock generator; wherein the phase difference signal is capable of being used as a measure of an integrated circuit age.