发明名称 |
Damped EGT probe |
摘要 |
A temperature probe includes a flange, a support structure, thermocouple wires, and guide plates. The flange has a midline. The support structure is attached to the midline and extends away from the flange. The thermocouple wires extend along the support structure, and terminate in a set of outer sensing tips and a set of inner sensing tips. The guide plates secure the thermocouple wires to the support structure. The guide plates are offset laterally from the midline of the flange. |
申请公布号 |
US8858074(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201213550174 |
申请日期 |
2012.07.16 |
申请人 |
United Technologies Corporation |
发明人 |
Greenberg Michael D.;Spence Ryan;Kelly William T.;DeLorme Joseph;McLarty Bobby J. |
分类号 |
G01K7/00;G01K1/00;G01F1/58 |
主分类号 |
G01K7/00 |
代理机构 |
Kinney & Lange, P.A. |
代理人 |
Kinney & Lange, P.A. |
主权项 |
1. A temperature probe comprising:
a flange having a midline; a support structure attached to the midline and extending away from the flange; thermocouple wires extending along the support structure, wherein the thermocouple wires terminate in a set of outer sensing tips and a set of inner sensing tips; and a first guide plate securing the thermocouple wires to the support structure, wherein the first guide plate is offset laterally from the midline of the flange by a first angle between about 6 degrees and about 18 degrees. |
地址 |
Hartford CT US |