发明名称 Semiconductor structure having aluminum layer with high reflectivity
摘要 A method for filling a trench with a metal layer is disclosed. A deposition apparatus having a plurality of supporting pins is provided. A substrate and a dielectric layer disposed thereon are provided. The dielectric layer has a trench. A first deposition process is performed immediately after the substrate is placed on the supporting pins to form a metal layer in the trench, wherein during the first deposition process a temperature of the substrate is gradually increased to reach a predetermined temperature. When the temperature of the substrate reaches the predetermined temperature, a second deposition process is performed to completely fill the trench with the metal layer. The present invention further provides a semiconductor device having an aluminum layer with a reflectivity greater than 1, wherein the semiconductor device is formed by using the method.
申请公布号 US8860135(B2) 申请公布日期 2014.10.14
申请号 US201213401788 申请日期 2012.02.21
申请人 United Microelectronics Corp. 发明人 Hsu Chi-Mao;Huang Hsin-Fu;Tsai Min-Chuan;Chen Chien-Hao;Chen Wei-Yu;Lin Chin-Fu;Li Jing-Gang;Chen Min-Hsien;Su Jian-Hong
分类号 H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;H01L23/48;H01L23/52;H01L29/40 主分类号 H01L29/76
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor device, comprising: a substrate; a dielectric layer disposed on the substrate, wherein the dielectric layer has a trench; and an aluminum layer completely filled into the trench, wherein a reflectivity of the aluminum layer is substantially greater than 1.
地址 Science-Based Industrial Park, Hsin-Chu TW