发明名称 |
Semiconductor structure having aluminum layer with high reflectivity |
摘要 |
A method for filling a trench with a metal layer is disclosed. A deposition apparatus having a plurality of supporting pins is provided. A substrate and a dielectric layer disposed thereon are provided. The dielectric layer has a trench. A first deposition process is performed immediately after the substrate is placed on the supporting pins to form a metal layer in the trench, wherein during the first deposition process a temperature of the substrate is gradually increased to reach a predetermined temperature. When the temperature of the substrate reaches the predetermined temperature, a second deposition process is performed to completely fill the trench with the metal layer. The present invention further provides a semiconductor device having an aluminum layer with a reflectivity greater than 1, wherein the semiconductor device is formed by using the method. |
申请公布号 |
US8860135(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201213401788 |
申请日期 |
2012.02.21 |
申请人 |
United Microelectronics Corp. |
发明人 |
Hsu Chi-Mao;Huang Hsin-Fu;Tsai Min-Chuan;Chen Chien-Hao;Chen Wei-Yu;Lin Chin-Fu;Li Jing-Gang;Chen Min-Hsien;Su Jian-Hong |
分类号 |
H01L29/76;H01L29/94;H01L31/062;H01L31/113;H01L31/119;H01L23/48;H01L23/52;H01L29/40 |
主分类号 |
H01L29/76 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A semiconductor device, comprising:
a substrate; a dielectric layer disposed on the substrate, wherein the dielectric layer has a trench; and an aluminum layer completely filled into the trench, wherein a reflectivity of the aluminum layer is substantially greater than 1. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |