发明名称 SILICON-GERMANIUM FINS AND SILICON FINS ON A BULK SUBSTRATE
摘要 <p>A first silicon-germanium alloy layer is formed on a semiconductor substrate including silicon. A stack of a first silicon layer and a second silicon-germanium alloy layer is formed over a first region of the first silicon-germanium alloy layer, and a second silicon layer thicker than the first silicon layer is formed over a second region of the first silicon-germanium alloy layer. At least one first semiconductor fin is formed in the first region, and at least one second semiconductor fin is formed in the second region. Remaining portions of the first silicon layer are removed to provide at least one silicon-germanium alloy fin in the first region, while at least one silicon fin is provided in the second region. Fin field effect transistors can be formed on the at least one silicon-germanium alloy fin and the at least one silicon fin.</p>
申请公布号 WO2014163747(A1) 申请公布日期 2014.10.09
申请号 WO2014US14999 申请日期 2014.02.06
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 UTOMO, HENRY, K.;CHENG, KANGGUO;DIVAKARUNI, RAMACHANDRA;NA, MYUNG-HEE;RAMACHANDRAN, RAVIKUMAR;SHANG, HUILING
分类号 H01L21/20 主分类号 H01L21/20
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