发明名称 |
FOUR-LINE ELECTRICAL IMPEDANCE PROBE |
摘要 |
A probe is configured for measuring an electrical impedance of a workpiece using external testing equipment. The probe includes a non-conducting base and an array of at least four spaced-apart line conductors. The at least four spaced-apart line conductors are disposed generally in parallel to each other along their lengths on a surface of the non-conducting base and are electrically connected to a corresponding array of at least four terminals on the non-conducting base. The non-conducting base is configured to be placed over a surface of the workpiece so that the at least four spaced-apart line conductors contact the surface of the workpiece and the at least four terminals are configured to be connected the external testing equipment. |
申请公布号 |
US2014303916(A1) |
申请公布日期 |
2014.10.09 |
申请号 |
US201414246007 |
申请日期 |
2014.04.04 |
申请人 |
Brigham Young University |
发明人 |
Mazzeo Brian Anthony;Wheeler Dean R. |
分类号 |
G01R27/14;G01R1/073 |
主分类号 |
G01R27/14 |
代理机构 |
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代理人 |
|
主权项 |
1. A probe, comprising:
a base; and a plurality of line conductors aligned substantially in parallel to each other on a surface of the base and electrically connected to a corresponding plurality of terminals on the base, the plurality of line conductors including at least four line conductors, the base configured to be placed over a surface of a workpiece so that the plurality of line conductors contact the surface of the workpiece, and the corresponding plurality of terminals configured to be connected to external testing equipment. |
地址 |
Provo UT US |