发明名称 FOUR-LINE ELECTRICAL IMPEDANCE PROBE
摘要 A probe is configured for measuring an electrical impedance of a workpiece using external testing equipment. The probe includes a non-conducting base and an array of at least four spaced-apart line conductors. The at least four spaced-apart line conductors are disposed generally in parallel to each other along their lengths on a surface of the non-conducting base and are electrically connected to a corresponding array of at least four terminals on the non-conducting base. The non-conducting base is configured to be placed over a surface of the workpiece so that the at least four spaced-apart line conductors contact the surface of the workpiece and the at least four terminals are configured to be connected the external testing equipment.
申请公布号 US2014303916(A1) 申请公布日期 2014.10.09
申请号 US201414246007 申请日期 2014.04.04
申请人 Brigham Young University 发明人 Mazzeo Brian Anthony;Wheeler Dean R.
分类号 G01R27/14;G01R1/073 主分类号 G01R27/14
代理机构 代理人
主权项 1. A probe, comprising: a base; and a plurality of line conductors aligned substantially in parallel to each other on a surface of the base and electrically connected to a corresponding plurality of terminals on the base, the plurality of line conductors including at least four line conductors, the base configured to be placed over a surface of a workpiece so that the plurality of line conductors contact the surface of the workpiece, and the corresponding plurality of terminals configured to be connected to external testing equipment.
地址 Provo UT US