发明名称 SAFE RESET CONFIGURATION OF FUSES AND FLOPS
摘要 Methods, apparatus, and fabrication techniques relating to improved propagation of fuse data through an integrated circuit device during scan shift reset. In some embodiments, the methods comprise loading a first value of at least one fuse bit to an integrated circuit device, during a time period when a clock signal having a first frequency is provided to at least one component of the integrated circuit device; disabling a scan shift after the loading of the first value; inactivating the clock signal after the loading of the first value; propagating the first value of the at least one fuse bit to the at least one component of the integrated circuit device; and reactivating the clock signal after the propagation of the first value.
申请公布号 US2014300395(A1) 申请公布日期 2014.10.09
申请号 US201313857085 申请日期 2013.04.04
申请人 ADVANCED MICRO DEVICES, INC. 发明人 Kommrusch Steven J.;Kwan Bill K.C.
分类号 H03K3/012 主分类号 H03K3/012
代理机构 代理人
主权项 1. A method, comprising: loading a first value to at least one fuse bit of an integrated circuit device, during a time period when a clock signal having a first frequency is provided to at least one component of the integrated circuit device; disabling a scan shift after the loading of the first value; inactivating the clock signal after the loading of the first value; propagating the first value from the at least one fuse bit to the at least one component of the integrated circuit device; and reactivating the clock signal after the propagation of the first value, wherein the clock signal has a second frequency after the propagation of the first value.
地址 Sunnyvale CA US