发明名称 CHEMICAL LINKERS TO IMPART IMPROVED MECHANICAL STRENGTH TO FLOWABLE FILMS
摘要 Methods forming a low-κ dielectric material on a substrate are described. The methods may include the steps of producing a radical precursor by flowing an unexcited precursor into a remote plasma region, and reacting the radical precursor with a gas-phase silicon precursor to deposit a flowable film on the substrate. The gas-phase silicon precursor may include at least one silicon-and-oxygen containing compound and at least one silicon-and-carbon linker. The flowable film may be cured to form the low-κ dielectric material.
申请公布号 US2014302690(A1) 申请公布日期 2014.10.09
申请号 US201314019861 申请日期 2013.09.06
申请人 Applied Materials, Inc. 发明人 Underwood Brian S.;Mallick Abhijit B.;Ingle Nitin K.
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of forming a low-κ dielectric material on a substrate, the method comprising: producing a radical precursor by flowing an unexcited precursor into a remote plasma region; reacting the radical precursor with a gas-phase silicon precursor and depositing a flowable film on the substrate, wherein the gas-phase silicon precursor comprises at least one silicon-and-oxygen containing compound and at least one silicon-and-carbon linker; and curing the flowable film to form the low-κ dielectric material.
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