发明名称 METHODS OF FORMING A FIELD EFFECT TRANSISTOR, INCLUDING FORMING A REGION PROVIDING ENHANCED OXIDATION
摘要 Methods of forming a Field Effect Transistor (FET) are provided. The methods may include forming a region that provides enhanced oxidation under a fin-shaped FET (FinFET) body.
申请公布号 US2014302645(A1) 申请公布日期 2014.10.09
申请号 US201313859482 申请日期 2013.04.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Rodder Mark S.;Seo Kang-ill
分类号 H01L21/762;H01L29/66 主分类号 H01L21/762
代理机构 代理人
主权项 1. A method of forming a Field Effect Transistor (FET), comprising: implanting ions into a substrate comprising a fin-shaped FET (FinFET) body protruding from the substrate, such that the FinFET body overlaps a portion of an implanted region of the ions; recessing the substrate to remove portions of the implanted region exposed by the FinFET body and such that the FinFET body overlaps a remaining portion of the implanted region; forming an isolation layer on the substrate and on sidewalls of the remaining portion of the implanted region; and oxidizing the remaining portion of the implanted region.
地址 Suwon-si KR