| 摘要 |
Disclosed is a system for inspecting foreign materials in a lens module, which determines a position where foreign materials are attached on the surfaces of an eyepiece or an infrared (IR) cut-off filter. The system for inspecting foreign materials in a lens module includes a light source unit which emits an illumination light; an optical system for illumination which controls a pencil of the illumination light released from the light source unit; an optical system for inspection which collects the illumination light penetrating through the lens module from the optical system for illumination to form a focal point; and a photographing unit which obtains an image of foreign materials by the illumination light passing through the optical system for inspection. |
