发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To reduce resistance between a second conductivity type well formed below a first conductivity type well in a substrate and a second conductivity type well formed in a horizontal direction of the first conductivity type well.SOLUTION: A semiconductor device comprises: a substrate; a first conductivity type well formed in the substrate; and a second conductivity type second well which has a first region formed in the substrate in a horizontal direction of the first conductivity type well and to a first depth from a surface of the substrate, and a second region which is formed at a depth deeper than the first depth from the surface of the substrate and connected to the first well.
申请公布号 JP2014192474(A) 申请公布日期 2014.10.06
申请号 JP20130068949 申请日期 2013.03.28
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 ARIYOSHI JUNICHI
分类号 H01L27/092;H01L21/265;H01L21/76;H01L21/8238;H01L27/08 主分类号 H01L27/092
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