发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To reduce resistance between a second conductivity type well formed below a first conductivity type well in a substrate and a second conductivity type well formed in a horizontal direction of the first conductivity type well.SOLUTION: A semiconductor device comprises: a substrate; a first conductivity type well formed in the substrate; and a second conductivity type second well which has a first region formed in the substrate in a horizontal direction of the first conductivity type well and to a first depth from a surface of the substrate, and a second region which is formed at a depth deeper than the first depth from the surface of the substrate and connected to the first well. |
申请公布号 |
JP2014192474(A) |
申请公布日期 |
2014.10.06 |
申请号 |
JP20130068949 |
申请日期 |
2013.03.28 |
申请人 |
FUJITSU SEMICONDUCTOR LTD |
发明人 |
ARIYOSHI JUNICHI |
分类号 |
H01L27/092;H01L21/265;H01L21/76;H01L21/8238;H01L27/08 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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