| 发明名称 |
LASER SCANNING MICROSCOPE |
| 摘要 |
A laser scanning microscope has an illumination beam path and a detection beam path. A beamsplitter is provided which reflects the illumination light in direction of the sample and transmits the detection light in direction of the detection arrangement. An additional beamsplitter is provided for reflecting the illumination light and for transmitting the detection light, this additional beamsplitter being arranged in the illumination beam path downstream of the first beamsplitter in the illumination direction, and this additional beamsplitter substantially transmits the illumination light reflected at the first beamsplitter and the detection light, but acquires a wavelength range substantially different from the first beamsplitter with respect to its reflectivity. |
| 申请公布号 |
US2014293410(A1) |
申请公布日期 |
2014.10.02 |
| 申请号 |
US201314068452 |
申请日期 |
2013.10.31 |
| 申请人 |
Carl Zeiss Microscopy GmbH |
发明人 |
Danckwerts Matthias;Wolleschensky Ralf;Steinert Joerg;Hauschild Robert;Wilhelm Stefan |
| 分类号 |
G02B21/00 |
主分类号 |
G02B21/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A laser scanning microscope comprising:
an illumination beam path of illumination light; a detection beam path of detection light; a first beamsplitter which reflects the illumination light in a direction of a sample, and transmits the detection light in a direction of a detection arrangement; and a second beamsplitter which reflects the illumination light and transmits the detection light; wherein the second beamsplitter is arranged in the illumination beam path downstream of the first beamsplitter in an illumination direction; and wherein the second beamsplitter transmits the illumination light reflected at the first beamsplitter and the detection light, but acquires a wavelength range different from the first beamsplitter with respect to the reflectivity of the second beamsplitter. |
| 地址 |
Jena DE |
