发明名称 Method of manufacturing semiconductor device, substrate processing method, substrate processing apparatus and recording medium
摘要 A method of manufacturing a semiconductor device includes: accommodating a substrate in a processing chamber; and supplying an organosilicon-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. In the forming of the film including silicon and carbon, a cycle is performed a predetermined number of times. The cycle includes supplying the organosilicon-based gas into the processing chamber and confining the organosilicon-based gas in the processing chamber, maintaining a state in which the organosilicon-based gas is confined in the processing chamber, and exhausting an inside of the processing chamber.
申请公布号 US8846546(B2) 申请公布日期 2014.09.30
申请号 US201213626889 申请日期 2012.09.26
申请人 Hitachi Kokusai Electric Inc. 发明人 Takeda Tsuyoshi
分类号 C23C16/455;H01L21/314;H01L21/205;H01L21/02;C23C16/32;C23C16/44 主分类号 C23C16/455
代理机构 SOLARIS Intellectual Property Group, PLLC 代理人 SOLARIS Intellectual Property Group, PLLC
主权项 1. A method of manufacturing a semiconductor device comprising: accommodating a substrate in a processing chamber; and supplying an organosilicon-based gas into the processing chamber, which is heated, to form a film including silicon and carbon on the substrate, wherein in the forming of the film including silicon and carbon, a cycle is performed a predetermined number of times, the cycle including alternately performing the following (a) and (b): (a) alternately performing a predetermined number of times: (a-1) supplying the organosilicon-based gas into the processing chamber and confining the organosilicon-based gas in the processing chamber, and(a-2) maintaining a state in which the organosilicon-based gas is confined in the processing chamber, and(b) exhausting an inside of the processing chamber.
地址 Tokyo JP