发明名称 |
Method of manufacturing semiconductor device, substrate processing method, substrate processing apparatus and recording medium |
摘要 |
A method of manufacturing a semiconductor device includes: accommodating a substrate in a processing chamber; and supplying an organosilicon-based gas into the processing chamber that is heated to form a film including silicon and carbon on the substrate. In the forming of the film including silicon and carbon, a cycle is performed a predetermined number of times. The cycle includes supplying the organosilicon-based gas into the processing chamber and confining the organosilicon-based gas in the processing chamber, maintaining a state in which the organosilicon-based gas is confined in the processing chamber, and exhausting an inside of the processing chamber. |
申请公布号 |
US8846546(B2) |
申请公布日期 |
2014.09.30 |
申请号 |
US201213626889 |
申请日期 |
2012.09.26 |
申请人 |
Hitachi Kokusai Electric Inc. |
发明人 |
Takeda Tsuyoshi |
分类号 |
C23C16/455;H01L21/314;H01L21/205;H01L21/02;C23C16/32;C23C16/44 |
主分类号 |
C23C16/455 |
代理机构 |
SOLARIS Intellectual Property Group, PLLC |
代理人 |
SOLARIS Intellectual Property Group, PLLC |
主权项 |
1. A method of manufacturing a semiconductor device comprising:
accommodating a substrate in a processing chamber; and supplying an organosilicon-based gas into the processing chamber, which is heated, to form a film including silicon and carbon on the substrate, wherein in the forming of the film including silicon and carbon, a cycle is performed a predetermined number of times, the cycle including alternately performing the following (a) and (b):
(a) alternately performing a predetermined number of times:
(a-1) supplying the organosilicon-based gas into the processing chamber and confining the organosilicon-based gas in the processing chamber, and(a-2) maintaining a state in which the organosilicon-based gas is confined in the processing chamber, and(b) exhausting an inside of the processing chamber. |
地址 |
Tokyo JP |