发明名称 |
SCAN CIRCUIT HAVING FIRST SCAN FLIP-FLOPS AND SECOND SCAN FLIP-FLOPS |
摘要 |
A scan circuit includes first scan flip-flops each including a first logic circuit to receive a plurality of control signals in addition to a scan input signal and a data input signal, and second scan flip-flops each including a second logic circuit to receive the plurality of control signals in addition to a scan input signal and a data input signal, wherein the first scan flip-flops and the second scan flip-flops are connected in series, and the plurality of control signals include only a one-bit reset signal and control signals whose purpose is other than an initialization purpose, and wherein the plurality of control signals are set to a predetermined combination of logic values to cause each of the first scan flip-flops to be initialized to “0” by the first logic circuit and each of the second scan flip-flops to be initialized to “1” by the second logic circuit. |
申请公布号 |
US2014289578(A1) |
申请公布日期 |
2014.09.25 |
申请号 |
US201414298061 |
申请日期 |
2014.06.06 |
申请人 |
FUJITSU LIMITED |
发明人 |
Sugiyama Itsumi |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
1. A scan circuit, comprising:
a plurality of first scan flip-flops each including a first logic circuit and each configured to receive a plurality of control signals in addition to a scan input signal and a data input signal that are to be latched; and a plurality of second scan flip-flops each including a second logic circuit and each configured to receive the plurality of control signals in addition to a scan input signal and a data input signal that are to be latched, wherein the first scan flip-flops and the second scan flip-flops are connected in series, and the plurality of control signals include only a one-bit reset signal and control signals whose purpose is other than an initialization purpose, and wherein the plurality of control signals are set to a predetermined combination of logic values to cause each of the first scan flip-flops to be initialized to “0” by the first logic circuit and to cause each of the second scan flip-flops to be initialized to “1” by the second logic circuit. |
地址 |
Kawasaki-shi JP |