发明名称 SCAN CIRCUIT HAVING FIRST SCAN FLIP-FLOPS AND SECOND SCAN FLIP-FLOPS
摘要 A scan circuit includes first scan flip-flops each including a first logic circuit to receive a plurality of control signals in addition to a scan input signal and a data input signal, and second scan flip-flops each including a second logic circuit to receive the plurality of control signals in addition to a scan input signal and a data input signal, wherein the first scan flip-flops and the second scan flip-flops are connected in series, and the plurality of control signals include only a one-bit reset signal and control signals whose purpose is other than an initialization purpose, and wherein the plurality of control signals are set to a predetermined combination of logic values to cause each of the first scan flip-flops to be initialized to “0” by the first logic circuit and each of the second scan flip-flops to be initialized to “1” by the second logic circuit.
申请公布号 US2014289578(A1) 申请公布日期 2014.09.25
申请号 US201414298061 申请日期 2014.06.06
申请人 FUJITSU LIMITED 发明人 Sugiyama Itsumi
分类号 G01R31/3177 主分类号 G01R31/3177
代理机构 代理人
主权项 1. A scan circuit, comprising: a plurality of first scan flip-flops each including a first logic circuit and each configured to receive a plurality of control signals in addition to a scan input signal and a data input signal that are to be latched; and a plurality of second scan flip-flops each including a second logic circuit and each configured to receive the plurality of control signals in addition to a scan input signal and a data input signal that are to be latched, wherein the first scan flip-flops and the second scan flip-flops are connected in series, and the plurality of control signals include only a one-bit reset signal and control signals whose purpose is other than an initialization purpose, and wherein the plurality of control signals are set to a predetermined combination of logic values to cause each of the first scan flip-flops to be initialized to “0” by the first logic circuit and to cause each of the second scan flip-flops to be initialized to “1” by the second logic circuit.
地址 Kawasaki-shi JP