发明名称 PERIODIC STRUCTURE AND MEASUREMENT METHOD EMPLOYING SAME
摘要 According to the present invention, a plate-shaped periodic structure includes at least two aperture portions extending through the periodic structure in a direction perpendicular to a main surface of the periodic structure and periodically arranged in at least one direction along the main surface. Each of the aperture portions has a shape that is not mirror-symmetric with respect to an imaginary plane that is a plane perpendicular to the main surface. Each of the aperture portions includes a constricted portion at which a gap distance of the aperture portion is partially small, the gap distance being a width in a direction parallel to a line of intersection of the main surface and the imaginary plane.
申请公布号 EP2781908(A1) 申请公布日期 2014.09.24
申请号 EP20120850549 申请日期 2012.08.17
申请人 MURATA MANUFACTURING CO., LTD. 发明人 KAMBA, SEIJI;TAKIGAWA, KAZUHIRO;KONDO, TAKASHI;TANAKA, KOJI
分类号 G01N21/35;G01N21/77 主分类号 G01N21/35
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