发明名称 Device and method for performing remote frequency response measurements
摘要 A system for measuring a property of a device under test (DUT) includes a stimulus signal generator and a receiver. The stimulus signal generator generates a repetitive stimulus signal under control of a first clock, and provides the stimulus signal to an input port of the DUT. The receiver receives an input signal output from the DUT, the input signal being based on the stimulus signal provided to the input port of the DUT. The receiver includes a second clock syntonized with the first clock, a memory that stores a calibration measurement of a calibration stimulus signal provided to the receiver during a calibration period without the DUT being connected to the stimulus signal generator, and a data processor configured to determine the property of the DUT by comparing the stored calibration measurement with a measurement of the input signal from the DUT performed under control of the second clock.
申请公布号 US8841923(B1) 申请公布日期 2014.09.23
申请号 US201012847057 申请日期 2010.07.30
申请人 Agilent Technologies, Inc. 发明人 Vanwiggeren Gregory Douglas
分类号 G01R23/02 主分类号 G01R23/02
代理机构 代理人
主权项 1. A system for measuring a property of a device under test (DUT), the system comprising: a stimulus signal generator configured to generate a repetitive stimulus signal under control of a first clock, and to provide the stimulus signal to an input port of the DUT; and a receiver configured to receive an input signal from an output port of the DUT, the input signal being based on the stimulus signal provided to the input port of the DUT, the receiver comprising: a second clock syntonized with the first clock, such that a second frequency of the second clock is the same as or derives from a first frequency of the first clock without synchronizing to the first clock;a memory configured to store a calibration measurement of a calibration stimulus signal provided to the receiver during a calibration period without the DUT being connected to the stimulus signal generator; anda data processor configured to determine the property of the DUT based on the stored calibration measurement and a measurement of the input signal from the DUT performed under control of the second clock.
地址 Santa Clara CA US