发明名称 |
Tapered via and MIM capacitor |
摘要 |
A chip capacitor and interconnecting wiring is described incorporating a metal insulator metal (MIM) capacitor, tapered vias and vias coupled to one or both of the top and bottom electrodes of the capacitor in an integrated circuit. A design structure tangibly embodied in a machine readable medium is described incorporating computer readable code defining a MIM capacitor, tapered vias, vias and wiring levels in an integrated circuit. |
申请公布号 |
US8842412(B2) |
申请公布日期 |
2014.09.23 |
申请号 |
US201414176460 |
申请日期 |
2014.02.10 |
申请人 |
International Business Machines Corporation |
发明人 |
Dunn James S.;He Zhong-Xiang;Stamper Anthony K. |
分类号 |
H01G4/30;H01L49/02 |
主分类号 |
H01G4/30 |
代理机构 |
|
代理人 |
Canale Anthony J.;Trepp Robert M. |
主权项 |
1. A method comprising:
selecting an insulating substrate having an upper surface and having a first wire in said insulating substrate; forming a first insulating layer over said upper surface of said insulating substrate and over said first wire; forming a first tapered opening in said first insulating layer over said first wire exposing said upper surface of said first wire; forming a bottom electrode of a capacitor on said first insulating layer; forming a first conductor over said upper surface of said first wire, said first tapered opening and said first insulating layer to said bottom electrode; forming a second insulating layer over said bottom electrode; and forming a top electrode of said capacitor on said second insulating layer positioned over said bottom electrode, said top electrode having a periphery interior of a periphery of said bottom electrode. |
地址 |
Armonk NY US |