发明名称 Tapered via and MIM capacitor
摘要 A chip capacitor and interconnecting wiring is described incorporating a metal insulator metal (MIM) capacitor, tapered vias and vias coupled to one or both of the top and bottom electrodes of the capacitor in an integrated circuit. A design structure tangibly embodied in a machine readable medium is described incorporating computer readable code defining a MIM capacitor, tapered vias, vias and wiring levels in an integrated circuit.
申请公布号 US8842412(B2) 申请公布日期 2014.09.23
申请号 US201414176460 申请日期 2014.02.10
申请人 International Business Machines Corporation 发明人 Dunn James S.;He Zhong-Xiang;Stamper Anthony K.
分类号 H01G4/30;H01L49/02 主分类号 H01G4/30
代理机构 代理人 Canale Anthony J.;Trepp Robert M.
主权项 1. A method comprising: selecting an insulating substrate having an upper surface and having a first wire in said insulating substrate; forming a first insulating layer over said upper surface of said insulating substrate and over said first wire; forming a first tapered opening in said first insulating layer over said first wire exposing said upper surface of said first wire; forming a bottom electrode of a capacitor on said first insulating layer; forming a first conductor over said upper surface of said first wire, said first tapered opening and said first insulating layer to said bottom electrode; forming a second insulating layer over said bottom electrode; and forming a top electrode of said capacitor on said second insulating layer positioned over said bottom electrode, said top electrode having a periphery interior of a periphery of said bottom electrode.
地址 Armonk NY US