发明名称 COLLECTOR MIRROR FOR AN EUV-LITHOGRAPHY DEVICE
摘要 In order to reduce the negative influence of contamination of a collector mirror on the reflectivity thereof, the invention proposes a collector mirror (13) for an EUV-lithography device, said mirror having a reflective coating (30) on a substrate (52) and a layer (56) made of silicon nitride on the side of the reflective coating (30) facing away from the substrate.
申请公布号 WO2014135537(A1) 申请公布日期 2014.09.12
申请号 WO2014EP54174 申请日期 2014.03.04
申请人 CARL ZEISS SMT GMBH 发明人 EHM, DIRK HEINRICH;VAN KAMPEN, MAARTEN;STORM, ARNOLDUS JAN;BECKER, MORITZ;SCHMIDT, STEFAN-WOLFGANG;HUIJBREGTSE, JEROEN;TE SLIGTE, EDWIN;VERBERK, ROGIER;BLANCKENHAGEN, GISELA VON
分类号 G03F7/20;G02B1/10;G02B5/08 主分类号 G03F7/20
代理机构 代理人
主权项
地址