发明名称 PATTERNED SILICON-ON-PLASTIC (SOP) TECHNOLOGY AND METHODS OF MANUFACTURING THE SAME
摘要 A semiconductor device and methods for manufacturing the same are disclosed. The semiconductor device includes a semiconductor stack structure attached to a wafer handle having at least one aperture that extends through the wafer handle to an exposed portion of the semiconductor stack structure. A thermally conductive and electrically resistive polymer substantially fills the at least one aperture and contacts the exposed portion of the semiconductor stack structure. One method for manufacturing the semiconductor device includes forming patterned apertures in the wafer handle to expose a portion of the semiconductor stack structure. The patterned apertures may or may not be aligned with sections of RF circuitry making up the semiconductor stack structure. A following step includes contacting the exposed portion of the semiconductor stack structure with a polymer and substantially filling the patterned apertures with the polymer, wherein the polymer is thermally conductive and electrically resistive.
申请公布号 US2014252567(A1) 申请公布日期 2014.09.11
申请号 US201414261029 申请日期 2014.04.24
申请人 RF Micro Devices, Inc. 发明人 Carroll Michael;Costa Julio;Kerr Daniel Charles;Willis Don;Glass Elizabeth
分类号 H01L29/02;H01L21/02 主分类号 H01L29/02
代理机构 代理人
主权项 1. A semiconductor device comprising: a semiconductor stack structure; a wafer handle attached to the semiconductor stack structure and having at least one aperture that extends through the wafer handle to an exposed portion of the semiconductor stack structure; and a polymer substantially filling the at least one aperture and contacting the exposed portion of the semiconductor stack structure, wherein the polymer is thermally conductive and electrically resistive.
地址 Greensboro NC US