发明名称 Tunnel-effect transistor
摘要 <p>The transistor (100) has source and drain extension regions (102, 103) on either side of a channel (101), where source and drain conductive regions (104, 105) are in contact with the extension regions. A gate structure (106) includes a gate dielectric layer (108) in contact with the channel. A gate area (107) is arranged such that the gate dielectric layer is arranged between the gate area and the channel. A doped area (120) is inserted between the channel and the drain extension region, to form a barrier for preventing charge carriers from escaping from the drain extension region.</p>
申请公布号 EP2775529(A2) 申请公布日期 2014.09.10
申请号 EP20140157282 申请日期 2014.02.28
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES 发明人 ANGHEL, COSTIN;LE ROYER, CYRILLE;MAKOSIEJ, ADAM
分类号 H01L29/739;H01L29/06;H01L29/417 主分类号 H01L29/739
代理机构 代理人
主权项
地址