发明名称 |
Tunnel-effect transistor |
摘要 |
<p>The transistor (100) has source and drain extension regions (102, 103) on either side of a channel (101), where source and drain conductive regions (104, 105) are in contact with the extension regions. A gate structure (106) includes a gate dielectric layer (108) in contact with the channel. A gate area (107) is arranged such that the gate dielectric layer is arranged between the gate area and the channel. A doped area (120) is inserted between the channel and the drain extension region, to form a barrier for preventing charge carriers from escaping from the drain extension region.</p> |
申请公布号 |
EP2775529(A2) |
申请公布日期 |
2014.09.10 |
申请号 |
EP20140157282 |
申请日期 |
2014.02.28 |
申请人 |
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES |
发明人 |
ANGHEL, COSTIN;LE ROYER, CYRILLE;MAKOSIEJ, ADAM |
分类号 |
H01L29/739;H01L29/06;H01L29/417 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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