发明名称 HIGH QUALITY FACTOR INDUCTOR IMPLEMENTED IN WAFER LEVEL PACKAGING (WLP)
摘要 Some novel features pertain to a first example provides a semiconductor device that includes a printed circuit board (PCB), asset of solder balls and a die. The PCB includes a first metal layer. The set of solder balls is coupled to the PCB. The die is coupled to the PCB through the set of solder balls. The die includes a second metal layer and a third metal layer. The first metal layer of the PCB, the set of solder balls, the second and third metal layers of the die are configured to operate as an inductor in the semiconductor device. In some implementations, the die further includes a passivation layer. The passivation layer is positioned between the second metal layer and the third metal layer. In some implementations, the second metal layer is positioned between the passivation layer and the set of solder balls.
申请公布号 US2014246753(A1) 申请公布日期 2014.09.04
申请号 US201313787219 申请日期 2013.03.06
申请人 QUALCOMM INCORPORATED 发明人 Song Young K.;Park Yunseo;Zhang Xiaonan;Lane Ryan D.;Nejati Babak;Hadjichristos Aristotele;Chen Xiaoming
分类号 H01L23/522;H01L23/00 主分类号 H01L23/522
代理机构 代理人
主权项 1. A semiconductor device comprising: a printed circuit board (PCB) comprising a first metal layer; a set of solder balls coupled to the PCB; and a die coupled to the PCB through the set of solder balls, the die comprising a second metal layer and a third metal layer, wherein the first metal layer of the PCB, the set of solder balls, the second and third metal layers of the die are configured to operate as an inductor in the semiconductor device.
地址 San Diego CA US