Automatic generation of valid at-speed structural test (ASST) test groups

摘要

A method and system is provided for automatically generating valid at speed structural test (ASST) test groups. The method includes loading a netlist for an integrated circuit into a processor. The method further includes determining a plurality of clock domain crossings between a plurality of clock domains within the integrated circuit. The method further includes generating a first test group. The method further includes adding a first clock domain of the plurality of clock domains to the first test group. The method further includes adding a second clock domain of the plurality of clock domains to the first test group when the second clock domain does not have a clock domain crossing into the first clock domain.

主权项

1. A method for automatically generating valid at speed structural test (ASST) test groups, comprising:
loading a netlist for an integrated circuit into a processor, the netlist comprising a crossing list for a plurality of clock domains; generating a domain specific table using the crossing list to arrange each clock domain of the plurality of clock domains as an index and each clock domain of the plurality of clock domains that communicate with each index as elements of the index; determining there is no domain crossings between a first clock domain of the plurality of clock domains and one or more of the plurality of clock domains associated with a first ASST test group using the crossing list; determining there is one or more of the elements within the first ASST test group using the domain specific table; determining there is no domain crossings between the first clock domain and the one or more of the elements within the first ASST test group using the domain specific table; and adding the first clock domain of the plurality of clock domains to the first ASST test group, wherein at least the step of generating the domain specific table is performed using the processor.