发明名称 METHOD FOR CONTROLLING DOPING PROFILE
摘要 The present invention relates to a method for controlling a thermal diffusion doping profile, which can selectively control the form of the thermal diffusion doping profile by presenting a diffusion degree (D) function having a plurality of variables and applying the diffusion degree (D) function to a doping profile function. To achieve the above purpose, the method for controlling a thermal diffusion doping profile according to the present invention is characterized by representing, by the following Equation 1, a doping profile formed within a crystalline silicon substrate by the thermal diffusion of impurity ions, representing the diffusion degree (D) of Equation 1 by the following Equation 2, and controlling the form of the doping profile by the control of variables (a, b, d, k) of Equation 2, wherein C is defined as doping density, D is defined as diffusion degree, x is defined as diffusion depth, and t is defined as diffusion time in Equation 1, and wherein D is defined as defined as diffusion degree and C is defined as doping density in Equation 2.
申请公布号 KR20140104071(A) 申请公布日期 2014.08.28
申请号 KR20130016861 申请日期 2013.02.18
申请人 HYUNDAI HEAVY INDUSTRIES CO., LTD. 发明人 LEE, JEONG WOO
分类号 G06F19/00;G06F17/10;H01L31/042 主分类号 G06F19/00
代理机构 代理人
主权项
地址