发明名称 Correction of cluster defects in imagers
摘要 A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.
申请公布号 US8817135(B2) 申请公布日期 2014.08.26
申请号 US201113112182 申请日期 2011.05.20
申请人 Micron Technology, Inc. 发明人 Jerdev Dmitri
分类号 H04N5/217 主分类号 H04N5/217
代理机构 Dickstein Shapiro LLP 代理人 Dickstein Shapiro LLP
主权项 1. A method of correcting a defective pixel in an imaging circuit, said imaging circuit having an array comprising a plurality of pixels, said method comprising: identifying a pixel for correction; selecting a first pair of pixels symmetrically located about the identified pixel and including a first pixel and a second pixel and a second pair of pixels symmetrically located about the identified pixel and, including a third pixel and a fourth pixel, said first pair of pixels and second pair of pixels being the nearest pixels of the same color as the identified pixel; and determining if at least one of said first, second, third and fourth pixels are defective; if said first, second, third, and fourth pixels are not defective: determining an average pixel value and a difference pixel value for said first pair of pixels and said second pair of pixels; and substituting said average pixel value of the one of said first pair of pixels and said second pair of pixels has the smallest difference pixel value for a pixel value of said identified pixel.
地址 Boise ID US