发明名称 p-TYPE GROUP III NITRIDE SEMICONDUCTOR MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To change a group III nitride semiconductor to a p-type with a less thermal load and at a high activation rate.SOLUTION: A p-type group III nitride semiconductor manufacturing method comprises: forming a transparent electrode 15 composed of an ITO on a p-contact layer 14; subsequently, performing a change of a p-clad layer 13 and the p-contact layer 14 to a p-type, and annealing of the transparent electrode 15 simultaneously as below. A wafer is introduced into a microwave heating device and microwave of a frequency of 5.8 GHz is radiated on the wafer in a nitrogen atmosphere to heat the wafer to 300-450°C for 3-30 minutes. This activates Mg in the p-clad layer 13 and the p-contact layer 14 thereby to change the p-clad layer 13 and the p-contact layer 14 to a p-type. At the same time, the transparent electrode 15 is subjected to annealing thereby to achieve improved crystallinity, low resistance and high transmissivity.
申请公布号 JP2014154584(A) 申请公布日期 2014.08.25
申请号 JP20130020551 申请日期 2013.02.05
申请人 TOYODA GOSEI CO LTD 发明人 UEMURA TOSHIYA
分类号 H01L21/268;H01L21/20;H01L21/205;H01L21/265;H01L21/28;H01L33/32 主分类号 H01L21/268
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