发明名称 IMAGE ANALYSIS PLATFORM FOR IDENTIFYING ARTIFACTS IN SAMPLES AND LABORATORY CONSUMABLES
摘要 A High-resolution Image Acquisition and Processing Instrument (HIAPI) performs at least five simultaneous measurements in a noninvasive fashion, namely: (a) determining the volume of a liquid sample in welh (or microtubes) containing liquid sample, (b) detection of precipitate, objects of artifacts within microliter plate wells, (c) classification of colored samples in microliter plate wells or microtubes; (dl determination of contaminant (e.g. wafer concentration}; (e) air bubbles; (f) problems with the actual plate. Remediation of contaminant is also possible.
申请公布号 US2014233797(A1) 申请公布日期 2014.08.21
申请号 US201414171078 申请日期 2014.02.03
申请人 The Scripps Research Institute 发明人 HODDER Peter;SCAMPAVIA Louis Daniel;BAILLARGEON Pierre Elliott
分类号 G01N21/55;G06T7/00;G06K9/00;G01N21/59 主分类号 G01N21/55
代理机构 代理人
主权项 1. A system comprising: a full-spectrum, ultraviolet, visible, infrared or near infra red light source for irradiating a consumable or consumable comprising a sample; at least one lens in optical alignment with light reflected, transmitted through or emitted from the sample; at least one sensor for detecting reflected light from the sample and/or light transmitted through the sample; a computer or processor running software for processing and analyzing the reflected or transmitted light.
地址 La Jolla CA US