MULTI OPTICAL AXIES ARRANGE INSPECTION DEVICE AND AXIES ARRANGING METHOD THEREOF
摘要
An apparatus for inspecting the axis arrangement of a multi-axis optical system comprises: a common target block (10) which forms a target from different wavelength bands; and an arc-shaped scope block (20) which reflects light in parallel toward an inspection optical device (100) where optical axis error arrangement is performed in order to form a path without any influence of parallax. The apparatus can inspect the optical axis arrangement of a multi-wavelength complex optical system by obtaining a central pixel position coordinate of a cross line based on the target for band 1 and band 2 images obtained from the inspection optical device (100), and then by calculating an arrangement error of two optical systems from a known field of view (FOV) and the number of pixels on a displayer, and can be easily manufactured at low prices and with mobility.
申请公布号
KR20140100771(A)
申请公布日期
2014.08.18
申请号
KR20130013930
申请日期
2013.02.07
申请人
AGENCY FOR DEFENSE DEVELOPMENT
发明人
KWAK, DONG MIN;KIM, HAN KYONG;SUNG, GI YEUL;YOON, JOO HONG;YOON, BYEONG SEON