发明名称 INTERLAYER POLYSILICON DIELECTRIC CAP AND METHOD OF FORMING THEREOF
摘要 <p>In some embodiments, an interlayer polysilicon dielectric cap disposed atop a substrate having a first floating gate, a second floating gate and an isolation layer disposed between the first floating gate and the second floating gate may include: a first nitrogen containing layer disposed atop an upper portion and sidewalls of the first floating gate and second floating gate; a first oxygen containing layer disposed atop the first nitrogen containing layer and an upper surface of the isolation layer; a second nitrogen containing layer disposed atop an upper portion and sidewalls of the first oxygen containing layer; and a second oxygen containing layer disposed atop the second nitrogen containing layer and an upper surface of the first oxygen containing layer.</p>
申请公布号 KR20140100948(A) 申请公布日期 2014.08.18
申请号 KR20147015276 申请日期 2012.11.07
申请人 APPLIED MATERIALS, INC. 发明人 ROGERS MATTHEW S.;SCHUEGRAF KLAUS
分类号 H01L27/115;H01L21/205;H01L21/31;H01L21/8247 主分类号 H01L27/115
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